2000 IEEE International Workshop on Defect Based Testing
April 30, 2000, Montreal, Canada : proceedings
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Author
Contributions
- Malaiya, Yashwant K. - Contributor
- Sachdev, Manoj. - Contributor
- Menon, Sankaran M. - Contributor
- IEEE Computer Society. Test Technology Technical Committee. - Contributor
- IEEE VLSI Test Symposium (2000 : Montréal, Québec) - Contributor
Publication
2000 - IEEE Computer Society, Los Alamitos, Calif, California
Language
English
Word Count
20,500 words, Guess
Page Count
82 pages
Identifiers
- Open LibraryOL6798331M
- ISBN-100769506372
- OCLC Control Number44935580
- Library of Congress Control Number00102862
- Goodreads1374302
Classifications
- DDC621.3815
- LCCTK7874 .I326 2000
Alternate Titles
- Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000
Subjects
Topics
Genres
- Congresses.
Other Editions
- 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000, Montreal, Canada : proceedings
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