Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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Author

Publication

2007-06-21 - Springer

Language

English

Word Count

82,000 words, Guess

Page Count

328 pages

Identifiers

Internet Archivedefectorientedte00sach_685
ISBN-100387465464
ISBN-139780387465463
OCLC Control Number79447484
Better World Books9780387465463

and 1 more

Open LibraryOL7445893M

Classifications

LCCTK7888.4TK1-9971TA17
LCCTK7871.99.M44 S23 2007

Subjects

Topics

Defects Testing Integrated circuits Very large scale integration Complementary Metal oxide semiconductors Metal oxide semiconductors, complementary Integrated circuits, very large scale integration

Other Editions

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)Springer2007-06-21

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