MOS Interface Physics Process and Characterization
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Word Count
40,500 words, Guess
Page Count
162 pages
Identifiers
- ISBN-101032106271
- ISBN-139781032106274
- Library of Congress Control Number2021017024
- OCLC Control Number1246675734
- Better World Books9781032106274
and 1 more
- Open LibraryOL33920275M
Classifications
- LCCTK7871.99.M44W358
- LCCTK7871.99.M44
Subjects
Topics
ResearchRechercheJunctionsJonctionsEngineeringMathematicsExperimentsExpériencesSemiconductorsSemi-conducteursCircuits intégrésIntegrated circuitsSolid state physicsTECHNOLOGY / GeneralDesign and constructionPhysique de l'état solideMetal oxide semiconductorsTECHNOLOGY / Electronics / GeneralTECHNOLOGY / Electronics / Microelectronics
Other Editions
- MOS Interface Physics Process and Characterization
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