Martin G. Buehler
Identifiers
- Open LibraryOL1948462A
Top Subjects
- Electronic apparatus and appliances -- Testing. (1)
- Integrated circuits -- Testing. (1)
- Microelectronics. (1)
- Semiconductors -- Testing. (1)
- Silicon -- Testing. (1)
- Electric measurements (1)
- Cryostats (1)
Books by Martin G. Buehler
Total count: 4
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Microelectronic test patternsan overviewNational Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]1974-01-01
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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurementsvideotape script.National Bureau of Standards1976-01-01
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Microelectronic test pattern NBS-3 for evaluating the resistivity-dopant density relationship of siliconU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1976-01-01
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Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape scriptU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1976-01-01