Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script
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Author
Publication
1976 - U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., Washington, District of Columbia
Language
English
Word Count
3,500 words, Guess
Page Count
14 pages
Identifiers
- Library of Congress Control Number76608059
- OCLC Control Number2075303
- OCLC Control Number2217236
- Open LibraryOL5016371M
Classifications
- DDC602/.1 s
- DDC621.3815/28
- LCCQC100 .U57 no. 400-26
and 1 more
- LCCTK7871.85 .U57 no. 400-26
Subjects
Topics
Series Statement
- Semiconductor measurement technology
- NBS special publication ; 400-26
- NBS special publication ;
- 400-26.
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