Microelectronic test patterns
an overview
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Author
Contributions
- United States. Defense Advanced Research Projects Agency. - Contributor
- United States. Defense Nuclear Agency. - Contributor
- United States. National Bureau of Standards. - Contributor
Publication
1974 - National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.], [Washington], District of Columbia
Language
English
Word Count
4,750 words, Guess
Page Count
19 pages
Identifiers
- Open LibraryOL5051537M
- OCLC Control Number979298
- Library of Congress Control Number74013001
Classifications
- DDC389/.08 s
- LCCQC100 .U57 no. 400-6
Subjects
Topics
Series Statement
- Semiconductor measurement technology
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